H19-435 Web TestEngine demo

In order to ensure performance, only all-flash nodes are supported

Random small IO' writes of different LUNs are aggregated into 100% sequential writes to improve performance

Large I/O directly group EC striping and displacement, but Cache, saving cache resources and improving cache life

Based on the WAL add-on write technology, the small IO is aggregated into a full-stripe EC disk to reduce write amplification